Solid-State eFuses vs. Electromechanical Relays: A 15-Year Automotive Reliability Study

Evaluating silicon aging, contact arcing elimination, and functional safety metrics in high-voltage and 48V zonal power architectures.

Thermal Derating and Silicon Lifespan

Calculations showing how silicon RDS(on) modulation across ambient temperatures prevents runaway thermal events in enclosed zonal boxes.

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